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Thermal Shock Testing

Thermal Shock Chambers Service

Thermal Shock Testing is a critical environmental stress test used to determine how well products and components can tolerate extreme and rapid changes of temperature. This method is essential in ensuring the long-term reliability and durability of materials and electronic devices, especially those intended for use in harsh or variable environments. The thermal shock chamber simulates conditions that a product might encounter during shipping, storage, or actual use—such as a sudden move from a cold climate to a hot desert, or rapid temperature cycling in aerospace and defence applications.

The primary objective of The Thermal Shock Test, a form of temperature testing and thermal cycle testing, is to evaluate a product’s ability to endure abrupt changes in ambient temperature without suffering from physical or functional failure. When materials expand or contract quickly due to sudden temperature shifts, stresses can develop internally or externally. These stresses may cause micro-cracks, delamination, fractures, loss of adhesion, or even catastrophic structural failure. By subjecting a product to repeated thermal cycling, engineers and quality assurance teams can detect latent defects that may not be apparent under normal testing conditions.

This testing is especially crucial for:

  • Electronic circuit boards and semiconductors
  • Aerospace and defence components
  • Automotive sensors and assemblies
  • Medical devices
  • Consumer electronics
  • Mechanical parts used in alternating environments

Standards Followed:

  • IEC 61300 -2 – 22
  • IEC 60068 – 2 – 14 Na & Nb
  • DIN EN IEC 60068 – 2 – 14 Na & Nb
  • IS 9000 Part 14 1, 2 &3
  • MIL Std, ASTM & JSS series
testing the temperature

Test Methodology and Equipment Overview of Thermal cycle testing

Thermal Shock Testing typically involves the use of a thermal shock chamber, which consists of two or more separate zones with controlled temperatures: a hot zone and a cold zone. The Device Under Test (DUT) is moved rapidly between these zones, exposing it to an extreme change in temperature in a very short amount of time—sometimes within seconds. Depending on the test configuration, the transfer of the DUT between temperature zones can occur through JSS 55555 Thermal Shock guidelines.

  • Air-to-air transfer: Common in electronic and mechanical testing where chambers are dry and operate via forced air convection.
  • Liquid-to-liquid transfer: Used for products that require immersion testing, offering faster and more aggressive temperature changes.
  • Air-to-liquid transfer: A hybrid method where different thermal mediums are used.

This rapid transfer process is automated, with a carrier system designed to move the DUT swiftly while maintaining integrity and avoiding additional mechanical stress. The dwell time—the amount of time the DUT spends in each zone—is carefully controlled to ensure temperature stabilization before transfer to the next zone.

Variable Working Spaces are available:

Dimensions are in mm

  • 500 x 600 x 600
  • 600 x 600 x 600
  • 600 x 600 x 600
  • 700 x 800 x 700
  • 700 x 800 x 700
  • 600 x 600 x 600
  • Industrial Equipment: Used in environments with fluctuating thermal exposure.

Following the thermal shock cycles, the DUT undergoes:

  • Visual inspections to check for signs of cracking, deformation, discoloration, or any other external physical damage.
  • Mechanical evaluations such as tensile or compression testing (if applicable).
  • Electrical performance tests to ensure the component or product still meets operational requirements and specifications.

Common Failures Detected

Physical defects:

  • Surface cracking or peeling
  • Warping or distortion of plastic or metal parts
  • Solder joint fractures on PCBs
  • Loosening of internal components due to differential expansion

Chemical changes:

  • Altered properties of adhesives, sealants, or coatings
  • Deterioration of encapsulants or insulation materials

Functional degradation:

  • Intermittent or complete loss of electrical connectivity
  • Signal drift or increased noise in sensors and analog components
  • Failure to meet voltage, current, or resistance specifications

Thermal Shock Chamber Capabilities

The chambers used for Thermal Shock Testing are highly specialized pieces of equipment designed for rapid and repeatable performance. The equipment parameters typically include:

Parameter Specification
Hot Zone Temperature Range +30°C to +180°C
Cold Zone Temperature Range +25°C to -70°C
Transfer Time Between Zones Less than 10 seconds (typical)
Dwell Time per Zone Configurable (5–30 minutes or more)
Cycle Count Adjustable (10 to 1000+ cycles)

Advanced thermal shock systems are computer-controlled, offering precise logging of temperature profiles, cycle counts, and dwell times. This ensures repeatability and documentation for regulatory or quality audits.

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